Atomic force microscope – Bruker Dimension 3100

The AFM “Dimension 3100” from Bruker is used for surface analysis of different samples. The AFM provides a Contact, Tapping and Magnetic mode what makes it possible to measure a huge variety of materials concerning their topography, friction and magnetic properties.

Specifications:

  • Z movement gauge head: 8 µm
  • X-Y movement gauge head: 100 µm x 100 µm
  • X-Y „Closed Loop“ control
  • Maximum sample size: ca. 2cm

 

 

Verantwortliche Mitarbeiter:

Prof. Dr. rer. nat. Mathias Göken

Head of Institute, Group Leader Nanomechanics

Department of Materials Science and Engineering
Chair of General Materials Properties


Anna Krapf

Department of Materials Science and Engineering
Chair of General Materials Properties