Atomic force microscope – Bruker Dimension 3100

The AFM “Dimension 3100” from Bruker is used for surface analysis of different samples. The AFM provides a Contact, Tapping and Magnetic mode what makes it possible to measure a huge variety of materials concerning their topography, friction and magnetic properties.

Specifications:

  • Z movement gauge head: 8 µm
  • X-Y movement gauge head: 100 µm x 100 µm
  • X-Y „Closed Loop“ control
  • Maximum sample size: ca. 2cm

 

 

Verantwortliche Mitarbeiter:

Prof. Dr. rer. nat. Mathias Göken

Head of Institute, Group Leader Nanomechanics

Department of Materials Science and Engineering
Chair of General Materials Properties